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Northwest Missouri State University

Atomic Force Microscopy (Photo by University Photography)

Atomic Force Microscopy (AFM) or High resolution AFM

Atomic Force Microscopy (AFM) is a method of measuring surface measuring surface topography on a scale from angstroms to 100 microns. The technique involves imaging a sample through the use of a probe, or tip, with a radius of 20 nm resolution in ambient air or liquids. AFM overcomes overcome the basic drawback of STM that it can only image conducting or semiconducting surfaces. Applications include imaging almost any type of surface, including polymers, biopolymers, ceramics, composites, glass, and biological samples.